Analyse chimique des surfaces — Microscopie à force atomique — Lignes directrices relatives au mode opératoire de restauration des images de microscopie à force atomique dilatées par la taille finie de la sonde

This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.